Benchtop ED XRF
Elemental analysis by EDXRF allows you to measure and monitor elements in almost any sample type. Whether you are improving the quality of products or optimizing industrial processes, we understand getting quick, high-quality results while also managing costs is critical. Applied Rigaku Technologies provides advanced, high-quality EDXRF analyzers and offers customer-focused solutions and support backed by Rigaku innovation and years of EDXRF experience.
NEX QC and NEX QC+
NEX QC:
Experience easy and affordable elemental analysis with the NEX QC analyzer, your gateway to fast results without complex setups or sample preparation. NEX QC provides non-destructive analyses of sodium to uranium in almost any sample type or material. It is made for quality control (QC) applications and can also measure the thickness of coatings on a substrate, such as chromium on aluminum or siliconized papers and films. Its small footprint, touchscreen operation, and built-in printer make it perfect when you are limited on space or for on-site testing purposes.
This instrument is designed for effortless operation and ease of use, even for non-technical operators. It has an embedded computer, and its touchscreen uses an intuitive icon-driven interface to guide you through analysis operations.
Product highlights:
- Compact, space-saving design, no external computer required
- Easy touchscreen operation and built-in printer for convenience
- User-friendly for all levels of personnel, even beginners
- Optional carrying case for portability
NEX QC+:
Unlock the power of faster elemental analysis.
When you need quicker analysis times or increased sample throughput, the NEX QC+ analyzer offers you speed and flexibility beyond what NEX QC offers. Key enhancements include a high-performance silicone drift detector (SDD), giving you a step up in overall performance. This advanced detector gives you improved peak resolution and counting statistics, as well as reduced measurement times. With the same ease of use, you get improved calibrations and precision for more demanding applications.
NEX QC+ QuantEZ
Take your elemental analysis to the next level with the NEX QC+ QuantEZ analyzer. This model offers a step up in performance and capabilities by adding powerful QuantEZ software. Designed for users who need more than an entry-level system, the NEX QC+ QuantEZ runs from an external desktop or laptop computer. The core unit no longer features a touchscreen panel, but configurations are available with it for a hybrid experience. NEX QC+ QuantEZ combines high-performance hardware with advanced software to simplify and streamline even the most complex workflows. This system transforms your experience with simple menu navigation and a customizable EZ Analysis screen. Unlike the base models, EZ Analysis uses an intuitive flow bar wizard for a step-by-step setup for creating your own methods. This simplifies method development to maximize your time and boost your productivity. This model also expands your range of applications with the availability of RPF-SQX Fundamental Parameters. This software option reduces the need for standards, which can be expensive and hard to obtain. SureDI is also offered to support compliance with 21 CFR Part 11. This option allows those in regulated industries, like pharmaceuticals and cosmetics, to meet FDA requirements confidently.
NEX DE and DE VS
The Rigaku NEX DE Series are high-performance, direct excitation EDXRF spectrometers that deliver exceptional elemental analysis capabilities. Utilizing a high-powered X-ray tube, these instruments provide superior analytical performance, including higher count rates, improved precision, and the ability to analyze even challenging materials with ease. This versatility allows the NEX DE Series to address a wide range of applications, from demanding quality control needs to those requiring small spot analysis. The series includes NEX DE and NEX DE VS.
The NEX DE and NEX DE VS models deliver high-performance results when analysis time or sample throughput is critical. They are designed for speed and precision, important for high-volume analytical labs or fast-paced settings.
They have a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a high-performance silicon drift detector (SDD) that supports count rates over 500K cps. The high-count rates provide low limits of detection and excellent spectral resolution, and high-throughput measurements are obtained with various interchangeable automatic sample changers. These features enable high-precision analytical results in the shortest possible measurement times.
Additionally, these instruments are packaged with QuantEZ software designed to simplify method development and maximize your time. The intuitive instrument control, simple menu navigation, and EZ Analysis interface streamline routine operations and allow you to create new methods using a simple flow bar wizard. These systems are well-suited for exploration, research, bulk RoHS inspection, education, forensics, and industrial and production monitoring applications.
For your small spot analysis needs, the NEX DE VS model features a high-resolution camera and automated collimators to allow for precise positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes. The instrument’s large sample chamber accommodates samples up to 30 cm in diameter and 10 cm tall, and the Point Analysis interface and integrated backlit camera allow easy sample positioning. NEX DE VS is an excellent option for measuring coatings on smaller parts, screening small samples for electronic waste initiatives, or investigating the identification of foreign matter of unknown composition.





